Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists / by Dong ZhiLi.

By:

Zhili, Dong [Author.]

Material type: Text

TextLanguage: English Series: Advances in materials science and engineeringPublication details: London : CRC Press, 2022.Description: xix, 266 p. : ill. ; 24 cmISBN:

9780367357948

Subject(s):

DDC classification:

548 ZHI/F

Summary: "The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. Written as an introduction to the topic with minimal reliance on advanced mathematics, the book will appeal to a broad spectrum of readers, including students, engineers, and researchers in materials science and engineering, applied physics, and chemical engineering. It can be used in XRD and TEM lab training"--

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Holdings
Item type	Current library	Home library	Collection	Call number	Status	Date due	Barcode	Item holds
Technical Reference Book	Central Library, IIT Bhubaneswar	Central Library, IIT Bhubaneswar	SMMME	548 ZHI/F (Browse shelf(Opens below))	Available		10640

Total holds: 0

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Includes bibliographical references and index.

"The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. Written as an introduction to the topic with minimal reliance on advanced mathematics, the book will appeal to a broad spectrum of readers, including students, engineers, and researchers in materials science and engineering, applied physics, and chemical engineering. It can be used in XRD and TEM lab training"--

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