Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists /

Zhili, Dong.

Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists / by Dong ZhiLi. - London : CRC Press, 2022. - xix, 266 p. : ill. ; 24 cm - Advances in materials science and engineering .

Includes bibliographical references and index.

"The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. Written as an introduction to the topic with minimal reliance on advanced mathematics, the book will appeal to a broad spectrum of readers, including students, engineers, and researchers in materials science and engineering, applied physics, and chemical engineering. It can be used in XRD and TEM lab training"--

9780367357948


Crystallography.--Analysis.
Materials
X-ray diffraction imaging.
Transmission electron microscopy.

548 / ZHI/F

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