Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists / (Record no. 13396)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 01426cam a22002778i 4500 |
| 001 - CONTROL NUMBER | |
| control field | 10640 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | IN-BhIIT |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20231211135534.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 211117s2022 flu b 001 0 eng |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9780367357948 |
| 040 ## - CATALOGING SOURCE | |
| Original cataloging agency | IN-BhIIT |
| 041 ## - LANGUAGE CODE | |
| Language code of text | eng |
| 082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 548 |
| Book number | ZHI/F |
| 100 1# - MAIN ENTRY--AUTHOR NAME | |
| Personal name | Zhili, Dong. |
| Relator term | Author. |
| 245 10 - TITLE STATEMENT | |
| Title | Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists / |
| Statement of responsibility, etc | by Dong ZhiLi. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication | London : |
| Name of publisher | CRC Press, |
| Year of publication | 2022. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | xix, 266 p. : |
| Other physical details(ill.) | ill. ; |
| Dimensions(size) | 24 cm |
| 490 0# - SERIES STATEMENT | |
| Series statement | Advances in materials science and engineering |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE | |
| Bibliography, etc | Includes bibliographical references and index. |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc | "The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. Written as an introduction to the topic with minimal reliance on advanced mathematics, the book will appeal to a broad spectrum of readers, including students, engineers, and researchers in materials science and engineering, applied physics, and chemical engineering. It can be used in XRD and TEM lab training"-- |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Crystallography. |
| General subdivision | Analysis. |
| Topical Term | Materials |
| Topical Term | X-ray diffraction imaging. |
| Topical Term | Transmission electron microscopy. |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Technical Reference Book |
| Withdrawn status | Lost status | Damaged status | Not for loan | Collection code | Home library | Current library | Date acquired | Source of acquisition | Cost, normal purchase price | Full call number | Accession Number | Cost, replacement price | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Not withdrawn | Not Lost | not damaged | SMMME | Central Library, IIT Bhubaneswar | Central Library, IIT Bhubaneswar | 26/09/2023 | 28 | 6860.29 | 548 ZHI/F | 10640 | 9397.66 | 26/09/2023 | Technical Reference Book |