| 000 | 00557nam a2200169Ia 4500 | ||
|---|---|---|---|
| 008 | 151218s9999 xx 000 0 und d | ||
| 020 |
_a9780780310629 _c |
||
| 040 |
_aCLIITBBS _cCLIITBBS _dCLIITBBS |
||
| 082 | 0 | 0 |
_a621.3815 _222 _bABR/D |
| 100 |
_aAbramovici, Miron. _921619 |
||
| 245 | 1 | 0 |
_aDigital systems testing and testable design / _b _cby Miron. Abramovici. |
| 260 |
_aNew York : _bIEEE Press, _c1990. |
||
| 300 | _axviii, 652 p: ill. ; | ||
| 504 | _aInclude Index | ||
| 650 |
_aDigital integrated circuits -- Testing. _921620 |
||
| 942 |
_2ddc _cTRB _01 |
||
| 999 |
_c6237 _d6237 |
||