| 000 | 00578nam a2200217Ia 4500 | ||
|---|---|---|---|
| 008 | 151211s9999 xx 000 0 und d | ||
| 020 | _a9783540434436 | ||
| 082 | _222 | ||
| 082 | _a539 | ||
| 082 | _bWAS/A | ||
| 100 | _aWaseda, Yoshio. | ||
| 245 | _aAnomalous X-ray scattering for materials characterization | ||
| 245 | _batomic-scale structure determination | ||
| 245 | _cby Yoshio Waseda. | ||
| 260 | _aBerlin | ||
| 260 | _bSpringer | ||
| 260 | _c2002 | ||
| 650 | _aMaterial sciences; -ray crystallography.; X-rays -- Scattering | ||
| 942 | _2ddc | ||
| 942 | _cTB | ||
| 999 |
_c4603 _d4603 |
||