000 | 00840nam a2200265Ia 4500 | ||
---|---|---|---|
008 | 151211s9999 xx 000 0 und d | ||
020 | _a9780387095783 | ||
020 | _cEur99.00 | ||
082 | _222 | ||
082 | _a548.83 | ||
082 | _bPEC/F | ||
100 |
_aPecharsky, Vitalij K. _918226 |
||
245 | _aFundamentals of powder diffraction and structural characterization of materials | ||
245 | _cby Vitalij K. Pecharsky and Peter Y. Zavalij. | ||
250 | _a2nd ed. | ||
260 | _aNew York | ||
260 | _bSpringer | ||
260 | _cc2009 | ||
300 | _axxiii, 741 p. : ill. ; 24 cm. | ||
504 | _aIncludes bibliographical references and index | ||
650 |
_aPowders--Optical properties--Measurement.; X-rays--Diffraction--Measurement.; X-ray crystallography _918227 |
||
700 |
_aZavalij, Peter Y. _918228 |
||
942 |
_2ddc _02 |
||
942 | _cTRB | ||
999 |
_c4098 _d4098 |