000			00592nam a2200217Ia 4500
008			151211s9999 xx 000 0 und d
020			_a9783540279853
082			_222
082			_a548.83
082			_bWIL/P
100			_aWill, Georg.
245			_aPowder diffraction
245			_bthe Rietveld method and the two-stage method to determine and refine crystal structures from powder diffraction data
245			_cby Georg Will
260			_aBerlin
260			_bSpringer
260			_c2006
650			_aX-rays -- Diffraction; Rietveld method
942			_2ddc
942			_cTRB
999			_c4096 _d4096