| 000 | 00993cam a22002654a 4500 | ||
|---|---|---|---|
| 001 | TB11691 | ||
| 003 | IN-BhIIT | ||
| 005 | 20240409114416.0 | ||
| 008 | 000829s2000 maua b 001 0 eng | ||
| 020 | _a9788132233299 | ||
| 040 | _aIN-BhIIT | ||
| 041 | _aeng | ||
| 082 | 0 | 0 |
_a621.395 _bBUS/E |
| 100 | 1 |
_aBushnell, Michael L. _eAuthor _922837 |
|
| 245 | 1 | 0 |
_aEssentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / _cby Michael L. Bushnell and Vishwani D. Agrawal. |
| 260 |
_aBoston : _bKluwer Academic, _cc2000. |
||
| 300 |
_axviii, 690 p. : _bill. ; _c26 cm. |
||
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 |
_aIntegrated circuits _xVery large scale integration _xTesting. _922832 |
|
| 650 | 0 |
_aDigital integrated circuits _xTesting. _922838 |
|
| 650 | 0 |
_aMixed signal circuits _xTesting. _922839 |
|
| 650 | 0 |
_aSemiconductor storage devices _xTesting. _922840 |
|
| 700 | 1 |
_aAgrawal, Vishwani D., _eJoint author _922841 |
|
| 942 |
_cTB _03 |
||
| 999 |
_c14121 _d14121 |
||