| 000 | 01426cam a22002778i 4500 | ||
|---|---|---|---|
| 001 | 10640 | ||
| 003 | IN-BhIIT | ||
| 005 | 20231211135534.0 | ||
| 008 | 211117s2022 flu b 001 0 eng | ||
| 020 | _a9780367357948 | ||
| 040 | _aIN-BhIIT | ||
| 041 | _aeng | ||
| 082 | 0 | 0 |
_a548 _bZHI/F |
| 100 | 1 |
_aZhili, Dong. _eAuthor. _921728 |
|
| 245 | 1 | 0 |
_aFundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists / _cby Dong ZhiLi. |
| 260 |
_aLondon : _bCRC Press, _c2022. |
||
| 300 |
_axix, 266 p. : _bill. ; _c24 cm |
||
| 490 | 0 | _aAdvances in materials science and engineering | |
| 504 | _aIncludes bibliographical references and index. | ||
| 520 | _a"The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. Written as an introduction to the topic with minimal reliance on advanced mathematics, the book will appeal to a broad spectrum of readers, including students, engineers, and researchers in materials science and engineering, applied physics, and chemical engineering. It can be used in XRD and TEM lab training"-- | ||
| 650 | 0 |
_aCrystallography. _xAnalysis. _921745 |
|
| 650 | 0 | _aMaterials | |
| 650 | 0 |
_aX-ray diffraction imaging. _921726 |
|
| 650 | 0 |
_aTransmission electron microscopy. _921727 |
|
| 942 | _cTRB | ||
| 999 |
_c13396 _d13396 |
||