000 | 00821 a2200253 4500 | ||
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001 | 10333 | ||
003 | IN-BhIIT | ||
005 | 20240118124219.0 | ||
008 | 230121b |||||||| |||| 00| 0 eng d | ||
020 | _a9780367538361 | ||
040 | _aIN-BhIIT | ||
041 | _aeng | ||
082 |
_a621.395 _bTRI/A |
||
245 |
_aAdvanced VLSI design and testability issues / _cSuman Lata Tripathi, Sobhit Saxena, Sushanta Kumar Mohapatra |
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260 |
_aBoca Raton : _bCRC Press, _c2021. |
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300 |
_axvii, 359 p. : _bill. ; _c23 cm. |
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504 | _aIncluding reference and index. | ||
650 |
_aIntegrated circuits _922068 |
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650 |
_aElectronics Microstructure _919419 |
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700 |
_aTripathi, Suman Lata _eEditor _919420 |
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700 |
_aSaxena, Sobhit _eEditor _919421 |
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700 |
_aMohapatra, Sushanta Kumar _eEditor _919422 |
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942 |
_cTRB _01 |
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999 |
_c12727 _d12727 |