Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /
by Michael L. Bushnell and Vishwani D. Agrawal.
- Boston : Kluwer Academic, c2000.
- xviii, 690 p. : ill. ; 26 cm.
Includes bibliographical references and index.
9788132233299
Integrated circuits--Very large scale integration--Testing. Digital integrated circuits--Testing. Mixed signal circuits--Testing. Semiconductor storage devices--Testing.