TY  - GEN
AU  - Navabi, Zainalabedin. 
TI  - Digital system test and testable design: : using HDL models and architectures 
SN  - 9788132214403
U1  - 621.3815 
PY  - 2011///
CY  - New Delhi
PB  - Springer
KW  - Digital electronics
KW  - Data processing
KW  - Electronic circuit design
N1  - Including bibliography and index
ER  -