Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists /
by Dong ZhiLi.
- London : CRC Press, 2022.
- xix, 266 p. : ill. ; 24 cm
- Advances in materials science and engineering .
Includes bibliographical references and index.
"The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. Written as an introduction to the topic with minimal reliance on advanced mathematics, the book will appeal to a broad spectrum of readers, including students, engineers, and researchers in materials science and engineering, applied physics, and chemical engineering. It can be used in XRD and TEM lab training"--
9780367357948
Crystallography.--Analysis. Materials X-ray diffraction imaging. Transmission electron microscopy.