Understanding single-crystal x-ray crystallography /
Bennett, Dennis W. 1946-
Understanding single-crystal x-ray crystallography / by Dennis W. Bennett. - Weinheim : Wiley-VCH, c2010. - xv, 807 p. : ill. (some col.) ; 25 cm.
Includes bibliographical references (p. [789]-799) and index.
Crystal lattices -- Crystal symmetry -- Crystal diffraction : theory -- Crystal diffraction : experiment -- Crystal diffraction : data -- Crystal structure solution : experimental -- Crystal structure solution : statistical -- Crystal structure refinement -- A geometric derivation of Bragg's Law -- The Fourier transform : electron density & the structure factor -- Determination of the phase parameter in the amplitude reflectivity ratio -- Reflection from a single plane -- A discussion of kinematical models for extinction -- Probability integrals : the modified Bessel function -- Monte Carlo optimization : a simple example -- Constrained optimization -- Taylor series.
9783527327942
1132794 000
bnb
X-ray crystallography.
Crystal lattices.
Einkristall.
Röntgenstrukturanalyse.
548.8 / BEN/U
Understanding single-crystal x-ray crystallography / by Dennis W. Bennett. - Weinheim : Wiley-VCH, c2010. - xv, 807 p. : ill. (some col.) ; 25 cm.
Includes bibliographical references (p. [789]-799) and index.
Crystal lattices -- Crystal symmetry -- Crystal diffraction : theory -- Crystal diffraction : experiment -- Crystal diffraction : data -- Crystal structure solution : experimental -- Crystal structure solution : statistical -- Crystal structure refinement -- A geometric derivation of Bragg's Law -- The Fourier transform : electron density & the structure factor -- Determination of the phase parameter in the amplitude reflectivity ratio -- Reflection from a single plane -- A discussion of kinematical models for extinction -- Probability integrals : the modified Bessel function -- Monte Carlo optimization : a simple example -- Constrained optimization -- Taylor series.
9783527327942
1132794 000
bnb
X-ray crystallography.
Crystal lattices.
Einkristall.
Röntgenstrukturanalyse.
548.8 / BEN/U